ECE 290 Seminar: “Photon Counting Detectors for X-Ray Imaging”
Presented by: Jin Zhang, Chief Engineer @ iRay Group
Description: “Photon-counting detectors measure individual X-ray interactions, enabling fine spatial sampling and energy-resolved imaging. This seminar connects semiconductor signal formation and readout electronics to imaging benefits and practical limitations in medical and industrial applications. It examines charge sharing, pulse pileup, calibration drift, and material decomposition, then surveys clinical PCCT systems and detector technologies from Siemens, GE, Canon, Varex, CERN, DECTRIS, and iRay. Examples span diagnostic CT, industrial inspection, and laboratory and synchrotron measurements. The discussion concludes with research priorities in sensor manufacturing, high-rate electronics, module integration, and quantitative validation. The central question is how to preserve useful spatial and spectral information at realistic flux, dose, and throughput, and demonstrate improvements through fair, task-specific comparisons.”
Bio: Jin Zhang, Ph.D., is an engineering and R&D leader with more than 20 years of experience in medical imaging, semiconductor detectors, and AI-enabled sensing. Currently Chief Engineer at iRay Group, he previously held leadership roles at Varex Imaging, Quanergy, and PerkinElmer, leading global teams across North America, Europe, and Asia. His expertise spans photon-counting detectors, image processing, and bringing advanced imaging technologies into commercial products. He earned his Ph.D. from the University of Rochester and completed postdoctoral research at Stanford University. He has authored more than 40 publications and holds a granted U.S. patent.
Hosted by: Professor Zhicong Yu, Electrical & Computer Engineering Department
When: Monday, October 12th from 10:40 to 11:45 AM PST
Location: Classroom E2-194